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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Measuring, Modeling, and Reproducing Material Appearance - State of the art of 3D scanning systems and inspection of textile surfaces
Ortiz Segovia, Maria V., Urban, Philipp, Allebach, Jan P., Montilla, M., Orjuela-Vargas, S. A., Philips, W.Volume:
9018
Year:
2014
Language:
english
DOI:
10.1117/12.2042552
File:
PDF, 306 KB
english, 2014