A different approach for determining the responsivity of n...

Journal of Semiconductors 2012 / 07 Vol. 33; Iss. 7

A different approach for determining the responsivity of n + p detectors using scanning electron microscopy

Esebamen, Omeime Xerviar, Thungström, Göran, Nilsson, Hans-Erik
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Volume:
33
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/33/7/074002
Date:
July, 2012
File:
PDF, 303 KB
english, 2012
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