Defect Characterization of Poly-Ge and VFG-Grown Ge...

Solid State Phenomena 2009 / 10 Vol. 156-158

Defect Characterization of Poly-Ge and VFG-Grown Ge Material

Holla, M., Arguirov, Tzanimir, Jia, G., Kittler, Martin, Frank-Rotsch, C., Kiessling, F.M., Rudolph, P.
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Volume:
156-158
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.156-158.483
Date:
October, 2009
File:
PDF, 545 KB
english, 2009
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