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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems - Analyzing the effect of tool edge radius on cutting temperature in micro-milling process
Liang, Y. C., Yang, K., Zheng, K. N., Bai, Q. S., Chen, W. Q., Sun, G. Y., Ye, Tianchun, Han, Sen, Kameyama, Masaomi, Hu, SongVolume:
7657
Year:
2010
Language:
english
DOI:
10.1117/12.867961
File:
PDF, 7.06 MB
english, 2010