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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII - Performance of buried channel n -type MOSFETs in 0.18-μm CMOS image sensor process
Stefanov, Konstantin D., Zhang, Zhige, Damerell, Chris, Burt, David, Kar-Roy, Arjun, Siegmund, Oswald H.Volume:
8859
Year:
2013
Language:
english
DOI:
10.1117/12.2024192
File:
PDF, 688 KB
english, 2013