New Characterization Methodology of Borderless Silicon Nitride Charge Kinetics Using C-V Hysteresis Loops
Beylier, G., Bruyère, S., Mora, P., Ghibaudo, G.Volume:
155
Year:
2008
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.2844353
File:
PDF, 671 KB
english, 2008