SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Sensing for Agriculture and Food Quality and Safety II - Damage and quality assessment in wheat by NIR hyperspectral imaging
Delwiche, Stephen R., Kim, Moon S., Dong, Yanhong, Kim, Moon S., Tu, Shu-I, Chao, KaunglinVolume:
7676
Year:
2010
Language:
english
DOI:
10.1117/12.851150
File:
PDF, 308 KB
english, 2010