SPIE Proceedings [SPIE SPIE Optical Engineering +...

  • Main
  • SPIE Proceedings [SPIE SPIE Optical...

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] X-Ray Nanoimaging: Instruments and Methods - Development of in-situ full-field spectroscopic imaging analysis and application on Li-ion battery using transmission x-ray microscopy

Lai, Barry, Chen-Wiegart, Yu-chen K., Wang, Jiajun, Wang, Jun
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8851
Year:
2013
Language:
english
DOI:
10.1117/12.2027095
File:
PDF, 1.29 MB
english, 2013
Conversion to is in progress
Conversion to is failed