SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] X-Ray Nanoimaging: Instruments and Methods - Development of in-situ full-field spectroscopic imaging analysis and application on Li-ion battery using transmission x-ray microscopy
Lai, Barry, Chen-Wiegart, Yu-chen K., Wang, Jiajun, Wang, JunVolume:
8851
Year:
2013
Language:
english
DOI:
10.1117/12.2027095
File:
PDF, 1.29 MB
english, 2013