SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Time and Frequency Metrology - Optical frequency standards based on mercury and aluminum ions
Itano, W. M., Bergquist, J. C., Brusch, A., Diddams, S. A., Fortier, T. M., Heavner, T. P., Hollberg, L., Hume, D. B., Jefferts, S. R., Lorini, L., Parker, T. E., Rosenband, T., Stalnaker, J. E., JoneVolume:
6673
Year:
2007
Language:
english
DOI:
10.1117/12.734662
File:
PDF, 263 KB
english, 2007
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