Degradation of Ultra-Thin Gate Oxide NMOSFETs under CVDT...

Degradation of Ultra-Thin Gate Oxide NMOSFETs under CVDT and SHE Stresses

Shi-Gang, Hu, Yan-Rong, Cao, Yue, Hao, Xiao-Hua, Ma, Chi, Chen, Xiao-Feng, Wu, Qing-Jun, Zhou
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Volume:
25
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/25/11/074
Date:
November, 2008
File:
PDF, 354 KB
english, 2008
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