Degradation of Ultra-Thin Gate Oxide NMOSFETs under CVDT and SHE Stresses
Shi-Gang, Hu, Yan-Rong, Cao, Yue, Hao, Xiao-Hua, Ma, Chi, Chen, Xiao-Feng, Wu, Qing-Jun, ZhouVolume:
25
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/25/11/074
Date:
November, 2008
File:
PDF, 354 KB
english, 2008