Desorption–ionization on silicon mass spectrometry: an...

Analytica Chimica Acta 2001 Vol. 442; Iss. 2

Desorption–ionization on silicon mass spectrometry: an application in forensics

John J. Thomas, Zhouxin Shen, Robert Blackledge, Gary Siuzdak
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Volume:
442
Year:
2001
Language:
english
Pages:
8
DOI:
10.1016/s0003-2670(01)01107-2
File:
PDF, 215 KB
english, 2001
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