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SPIE Proceedings [SPIE Electronic Imaging '97 - San Jose, CA (Saturday 8 February 1997)] Machine Vision Applications in Industrial Inspection V - Image understanding algorithms for remote visual inspection of aircraft surfaces
Gunatilake, Priyan, Siegel, Mel, Jordan, Angel G., Podnar, Gregg W., Rao, A. Ravishankar, Chang, Ning S.Volume:
3029
Year:
1997
Language:
english
DOI:
10.1117/12.271231
File:
PDF, 799 KB
english, 1997