High Total Ionizing Dose and Temperature Effects on Micro-...

IEEE Transactions on Nuclear Science 2015 / 6 Vol. 62; Iss. 3

High Total Ionizing Dose and Temperature Effects on Micro- and Nano-Electronic Devices

Gaillardin, M., Martinez, M., Girard, S., Goiffon, V., Paillet, P., Leray, J. L., Magnan, P., Ouerdane, Y., Boukenter, A., Marcandella, C., Duhamel, O., Raine, M., Richard, N., Andrieu, F., Barraud, S
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2416975
Date:
June, 2015
File:
PDF, 905 KB
english, 2015
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