SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering - Virtual optical laboratory for speckle metrology
Kornis, Janos, Nemeth, Attila, Fuezessy, Zoltan, Hoefling, Roland, Jueptner, Werner P. O., Kujawinska, MalgorzataVolume:
4399
Year:
2001
Language:
english
DOI:
10.1117/12.445582
File:
PDF, 2.99 MB
english, 2001