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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - The growth of cubic boron nitride films on the interlayer of nickel by RF sputter
Guo, Qingxiu, Deng, Jinxiang, Cui, Min, Zhao, Weiping, Yang, Bing, Yang, Ping, Kong, Le, Jiang, Ya-Dong, Kippelen, Bernard, Yu, JunshengVolume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.865918
File:
PDF, 1.71 MB
english, 2010