[IEEE 2014 IEEE Emerging Technology and Factory Automation (ETFA) - Barcelona, Spain (2014.9.16-2014.9.19)] Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA) - Device status information service architecture for condition monitoring using OPC UA
Hastbacka, David, Barna, Laurentiu, Karaila, Mika, Liang, Yiqing, Tuominen, Pasi, Kuikka, SeppoYear:
2014
Language:
english
DOI:
10.1109/ETFA.2014.7005141
File:
PDF, 1.66 MB
english, 2014