EBSD Analysis of Grain Boundary Characteristics of Abnormally Grain Grown Alumina
Kim, Dong Ik, Lee, Je Hun, Kim, Young Wook, Oh, Kyu Hwan, Lee, Hu ChulVolume:
408-412
Year:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.408-412.1699
File:
PDF, 383 KB
2002