Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL
Da-Rui, Sun, Jin-Qiang, Xu, Sen-Yu, ChenVolume:
34
Language:
english
Journal:
Chinese Physics C
DOI:
10.1088/1674-1137/34/2/014
Date:
February, 2010
File:
PDF, 258 KB
english, 2010