Analysis of the resistive switching behaviors of vanadium oxide thin film
Wei, Xiao-Ying, Hu, Ming, Zhang, Kai-Liang, Wang, Fang, Zhao, Jin-Shi, Miao, Yin-PingVolume:
22
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/22/3/037201
Date:
March, 2013
File:
PDF, 691 KB
english, 2013