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Correlation between Current Transport and Defects in n+/p 6H-SiC Diodes
Canino, Mariaconcetta, Castaldini, Antonio, Cavallini, Anna, Moscatelli, Francesco, Nipoti, Roberta, Poggi, AntonellaVolume:
527-529
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.527-529.811
File:
PDF, 250 KB
english, 2006