SPIE Proceedings [SPIE Laser Metrology for Precision Management and Inspection in Industry - Florianopolis, Brazil (Thursday 22 February 2001)] Laser Metrology for Precision Measurement and Inspection in Industry - Unique criterion to estimate the performances of some laser diode range finders
Journet, Bernard A., Bazin, Gaelle, Durieu, Cecile, Albertazzi, Jr., ArmandoVolume:
4420
Year:
2001
Language:
english
DOI:
10.1117/12.439213
File:
PDF, 481 KB
english, 2001