SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in X-Ray/EUV Optics and Components IX - Phase characterization of attosecond multilayer mirrors: from EUV to soft x-rays
Morawe, Christian, Khounsary, Ali M., Goto, Shunji, Delmotte, Franck, Bourassin-Bouchet, Charles, de Rossi, Sébastien, Meltchakov, Evgueni, Giglia, Angelo, Nannarone, StefanoVolume:
9207
Year:
2014
Language:
english
DOI:
10.1117/12.2061022
File:
PDF, 332 KB
english, 2014