SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose, CA (Saturday 23 January 1999)] Sensors, Cameras, and Systems for Scientific/Industrial Applications - New technologies of photosensitivity improvement and VOD shutter voltage reduction for CCD image sensors

Murakami, Ichiro, Nakano, Takashi, Hatano, Keisuke, Nakashiba, Yasutaka, Furumiya, Masayuki, Nagata, Tsuyoshi, Utsumi, Hiroaki, Uchiya, Satoshi, Arai, Kouichi, Mutoh, Nobuhiko, Kohno, Akiyoshi, Terani
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Volume:
3649
Year:
1999
Language:
english
DOI:
10.1117/12.347077
File:
PDF, 907 KB
english, 1999
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