Single-Atomic-Level Probe of Transient Carrier Dynamics by...

Applied Physics Express 2013 / 03 Vol. 6; Iss. 3

Single-Atomic-Level Probe of Transient Carrier Dynamics by Laser-Combined Scanning Tunneling Microscopy

Yoshida, Shoji, Yokota, Munenori, Takeuchi, Osamu, Oigawa, Haruhiro, Mera, Yutaka, Shigekawa, Hidemi
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Volume:
6
Language:
english
Journal:
Applied Physics Express
DOI:
10.7567/APEX.6.032401
Date:
March, 2013
File:
PDF, 236 KB
english, 2013
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