Temperature Dependence of Off-Current in Bulk and Fully...

Japanese Journal of Applied Physics 2005 / 4 Vol. 44; Iss. 4B

Temperature Dependence of Off-Current in Bulk and Fully Depleted SOI MOSFETs

Miyaji, Kousuke, Saitoh, Masumi, Nagumo, Toshiharu, Hiramoto, Toshiro
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Volume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.44.2371
Date:
April, 2005
File:
PDF, 2.45 MB
english, 2005
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