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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optics, Photonics, and Digital Technologies for Multimedia Applications - Unsupervised flaw segmentation in textile materials under visible and NIR illumination
Schelkens, Peter, Millán, María S., Escofet, Jaume, Ebrahimi, Touradj, Cristóbal, Gabriel, Ralló, Miquel, Truchetet, Frédéric, Saarikko, PasiVolume:
7723
Year:
2010
Language:
english
DOI:
10.1117/12.854895
File:
PDF, 9.87 MB
english, 2010