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Assessment of transistors based on GaN on silicon substrate in view of integration with silicon technology
Soltani, A, Cordier, Y, Gerbedoen, J-C, Joblot, S, Okada, E, Chmielowska, M, Ramdani, M R, De Jaeger, J-CVolume:
28
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/28/9/094003
Date:
September, 2013
File:
PDF, 172 KB
english, 2013