Structural characterization of polycrystalline Ge thin...

Structural characterization of polycrystalline Ge thin films on insulators formed by diffusion-enhanced Al-induced layer exchange

Numata, Ryohei, Toko, Kaoru, Oya, Naoki, Usami, Noritaka, Suemasu, Takashi
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Volume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.04EH03
Date:
April, 2014
File:
PDF, 1.08 MB
english, 2014
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