Structural characterization of polycrystalline Ge thin films on insulators formed by diffusion-enhanced Al-induced layer exchange
Numata, Ryohei, Toko, Kaoru, Oya, Naoki, Usami, Noritaka, Suemasu, TakashiVolume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.04EH03
Date:
April, 2014
File:
PDF, 1.08 MB
english, 2014