SPIE Proceedings [SPIE SPIE Optical Engineering +...

  • Main
  • SPIE Proceedings [SPIE SPIE Optical...

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Reflection, Scattering, and Diffraction from Surfaces III - Converting surface roughness data into PSD and BSDF

Pfisterer, Richard N., Hanssen, Leonard M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8495
Year:
2012
Language:
english
DOI:
10.1117/12.931671
File:
PDF, 321 KB
english, 2012
Conversion to is in progress
Conversion to is failed