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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Reflection, Scattering, and Diffraction from Surfaces III - Converting surface roughness data into PSD and BSDF
Pfisterer, Richard N., Hanssen, Leonard M.Volume:
8495
Year:
2012
Language:
english
DOI:
10.1117/12.931671
File:
PDF, 321 KB
english, 2012