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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Oxide-based Materials and Devices IV - C-AFM and KPFM approach to investigate the electrical properties of single grain boundaries in ZnO varistor devices
Nevosad, A., Hofstaetter, M., Wiessner, M., Supancic, P., Teichert, C., Teherani, Ferechteh Hosseini, Look, David C., Rogers, David J.Volume:
8626
Year:
2013
Language:
english
DOI:
10.1117/12.2013532
File:
PDF, 962 KB
english, 2013