Annealing behavior of radiation damage in JFET-input operational amplifiers
Yuzhan, Zheng, Wu, Lu, Diyuan, Ren, Yiyuan, Wang, Qi, Guo, Xuefeng, YuVolume:
30
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/30/5/055001
Date:
May, 2009
File:
PDF, 1.87 MB
english, 2009