![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Applications of Digital Image Processing XXXVII - Statistical feature selection for enhanced detection of brain tumor
Tescher, Andrew G., Chaddad, Ahmad, Colen, Rivka R.Volume:
9217
Year:
2014
Language:
english
DOI:
10.1117/12.2062143
File:
PDF, 472 KB
english, 2014