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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 1 February 2014)] Oxide-based Materials and Devices V - Nanoscale optical and electrical characterizations of ZnO nanostructures by near-field microscopy
Teherani, Ferechteh H., Look, David C., Rogers, David J., Bercu, Bogdan, Giraudet, Louis, Molinari, MichaelVolume:
8987
Year:
2014
Language:
english
DOI:
10.1117/12.2042151
File:
PDF, 4.19 MB
english, 2014