SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Gallium Nitride Materials and Devices VI - Direct observation of lattice constant variations depending on layer structures in an InGaN/GaN MQW LED
Kimura, Shigeya, Tachibana, Koichi, Oka, Toshiyuki, Nago, Hajime, Yoshida, Hisashi, Nunoue, Shinya, Chyi, Jen-Inn, Nanishi, Yasushi, Morkoç, Hadis, Piprek, Joachim, Yoon, EuijoonVolume:
7939
Year:
2011
Language:
english
DOI:
10.1117/12.874626
File:
PDF, 995 KB
english, 2011