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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 21 August 2011)] Imaging Spectrometry XVI - Alignment and characterization of high uniformity imaging spectrometers

Bender, Holly A., Mouroulis, Pantazis, Eastwood, Michael L., Green, Robert O., Geier, Sven, Hochberg, Eric B., Shen, Sylvia S., Lewis, Paul E.
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Volume:
8158
Year:
2011
Language:
english
DOI:
10.1117/12.892798
File:
PDF, 2.61 MB
english, 2011
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