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SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - Extreme high resolution scanning electron microscopy (XHR SEM) and beyond
Roussel, Laurent Y., Postek, Michael T., Newbury, Dale E., Stokes, Debbie J., Gestmann, Ingo, Platek, S. Frank, Joy, David C., Darus, Mark, Young, Richard J.Volume:
7378
Year:
2009
Language:
english
DOI:
10.1117/12.821826
File:
PDF, 1.83 MB
english, 2009