[IEEE 1991 IEEE MTT-S International Microwave Symposium Digest - Boston, MA, USA (10-14 June 1991)] 1991 IEEE MTT-S International Microwave Symposium Digest - Accurate nonlinear transistor modeling using pulsed S parameters measurements under pulsed bias conditions
Vidalou, J.F., Grossier, J.F., Chaumas, M., Camiade, M., Roux, P., Obregon, J.Year:
1991
DOI:
10.1109/mwsym.1991.146933
File:
PDF, 358 KB
1991