Degradation of the transconductance of a gate-modulated...

Chinese Physics B 2012 / 08 Vol. 21; Iss. 8

Degradation of the transconductance of a gate-modulated generation current in nMOSFET

Chen, Hai-Feng, Guo, Li-Xin, Du, Hui-Min
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Volume:
21
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/21/8/088501
Date:
August, 2012
File:
PDF, 462 KB
english, 2012
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