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Stress-induced roughness development during oxide scale growth on a metallic alloy for SOFC interconnects
Saillard, Audric, Cherkaoui, Mohammed, Kadiri, Haitham ElVolume:
19
Language:
english
Journal:
Modelling and Simulation in Materials Science and Engineering
DOI:
10.1088/0965-0393/19/1/015009
Date:
January, 2011
File:
PDF, 1.77 MB
english, 2011