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SPIE Proceedings [SPIE Defense and Security Symposium - Orlando, FL (Monday 9 April 2007)] Passive Millimeter-Wave Imaging Technology X - Determination of dielectric material properties using passive MMW measurements for security applications
Dill, Stephan, Peichl, Markus, Suess, Helmut, Appleby, Roger, Wikner, David A.Volume:
6548
Year:
2007
Language:
english
DOI:
10.1117/12.720221
File:
PDF, 617 KB
english, 2007