Electrical Characterization of Deep Trap Properties in...

Electrical Characterization of Deep Trap Properties in High- k Thin-Film HfO 2

Dielectric,, Lu, Yang
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Volume:
27
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/27/7/077102
Date:
July, 2010
File:
PDF, 353 KB
english, 2010
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