SPIE Proceedings [SPIE 3rd International Symposium on...

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SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Determination of optical constants of zirconia and silica thin films in UV to visible range

Jin, Weihua, Jin, Chunshui, Zhu, Hongli, Liu, Lei, Yang, Huaijiang, Yang, Li, Chen, Yaolong, Kley, Ernst-Bernhard, Li, Rongbin
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Volume:
6722
Year:
2007
Language:
english
DOI:
10.1117/12.782900
File:
PDF, 395 KB
english, 2007
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