Leakage Current Suppression on Metal-Induced Laterally Crystallized Polycrystalline Silicon Thin-Film Transistors by Asymmetrically Deposited Nickel
Byun, Chang Woo, Son, Se Wan, Lee, Yong Woo, Park, Jae Hyo, Takaloo, Ashkan Vakilipour, Joo, Seung KiVolume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.10MA01
Date:
October, 2013
File:
PDF, 255 KB
english, 2013