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SPIE Proceedings [SPIE International Conference on Optical Particle Characterization (OPC 2014) - Tokyo, Japan (Monday 10 March 2014)] International Conference on Optical Particle Characterization (OPC 2014) - Laser-diffraction based drop-sizing system using image sensor
Aya, Nobuhiro, Iki, Norihiko, Shimura, Tsutomu, Shirai, Tomohiro, Suzuki, T., Harase, K.Volume:
9232
Year:
2014
Language:
english
DOI:
10.1117/12.2063606
File:
PDF, 683 KB
english, 2014