Acceptor Deactivation in Silicon Nanowires Analyzed by...

Solid State Phenomena 2011 / 8 Vol. 178-179

Acceptor Deactivation in Silicon Nanowires Analyzed by Scanning Spreading Resistance Microscopy

Kögler, Reinhard, Ou, Xin, Geyer, Nadine, Das Kanungo, Pratyush, Schwen, Daniel, Werner, Peter, Skorupa, Wolfgang
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Volume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.178-179.50
Date:
August, 2011
File:
PDF, 1.05 MB
english, 2011
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