SPIE Proceedings [SPIE First European Conference on Optics Applied to Metrology - Strasbourg, France (Wednesday 26 October 1977)] 1st European Conf on Optics Applied to Metrology - Analysis Of The Diffraction Spectrum Of A Population Of Particles
Fleuret, J., Maitre, H., Thery, J. F., Grosmann, Michel H., Meyrueis, PatrickVolume:
136
Year:
1978
Language:
english
DOI:
10.1117/12.956172
File:
PDF, 285 KB
english, 1978