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SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Ellipsometric study of rare gas films physisorbed on a surface of a metal single crystal
Igarashi, Sin-ichi, Hirayama, Takato, Arakawa, Ichiro, Abe, Yukio, Yoshizawa, Toru, Yokota, HideshiVolume:
2873
Year:
1996
Language:
english
DOI:
10.1117/12.246227
File:
PDF, 141 KB
english, 1996