Detection of deviations in semiconductor periodic...

Detection of deviations in semiconductor periodic structures by the finite-difference time-domain technique

Klein, David, Singher, Liviu
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Volume:
24
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/24/10/105202
Date:
October, 2013
File:
PDF, 274 KB
english, 2013
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