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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Gallium Nitride Materials and Devices X - Strong carrier localization in stacking faults in semipolar (11-22) GaN
Chyi, Jen-Inn, Fujioka, Hiroshi, Morkoç, Hadis, Okur, Serdal, Monavarian, Morteza, Das, Saikat, Izyumskaya, Natalia, Zhang, Fan, Avrutin, Vitaliy, Morkoç, Hadis, Özgür, ÜmitVolume:
9363
Year:
2015
Language:
english
DOI:
10.1117/12.2080248
File:
PDF, 599 KB
english, 2015