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Microstructural and Electrical Properties of NiSi2 Precipitates at Dislocations in Silicon
Seibt, Michael, Kveder, VitalyVolume:
95-96
Year:
2004
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.95-96.447
File:
PDF, 625 KB
2004